Introduction
Next-generation Cartesian Geometry EDXRF Analyzer. As a multi-element, multi-purpose EDXRF spectrometer, the powerful second-generation NEX CG II delivers rapid qualitative and quantitative elemental analyses and addresses the needs for many applications. Rigaku NEX CG II is ideal for measuring ultra-low and trace element concentrations up to percent levels. It provides non-destructive analysis of sodium (Na) to uranium (U) in almost any matrix — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
Features
- Non-destructive elemental analysis for sodium (Na) to uranium (U)
- Solids, liquids, powders and thin films
- Indirect excitation for exceptionally low detection limits
- High-power 50 kV, 50 W X-ray tube
- Large-area high-throughput silicon drift detector (SDD)
- Analysis in air, helium or vacuum
- Powerful and easy to use QuantEZ® software with multilingual user interface
- Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
- Various automatic sample changers accommodating up to 52 mm samples
Measures
Applications suited to the NEX CG performance include:
- soil & crop analysis – (full elemental make up, 24 elements)
- fly ash analysis – ( multiple element analysis, 16)
- glass and raw material analysis – ( multiple element analysis,14)
- brake pad analysis – (multiple element analysis, 28)
- crude oil – ultra low Cl and S







