This analyser offers multi-position bulk analysis in addition to a large single position sample stage, with three analysis spot size 
options – 1 mm, 3 mm and 10 mm – that are easily changeable by the system's automatic collimators. A high resolution camera and LED lighting system allows a sample's image to be recorded via the Windows software interface. 

The powerful 60kV X-ray tube and Peltier cooled FAST SDD® Silicon Drift Detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD). 

XRF options: autosampler, helium and standardless FP Options include fundamental parameters, a variety of automatic sample 
changers, sample spinner and helium purge for enhanced light element sensitivity. 

The shuttered 50kV X-ray tube and Peltier cooled Silicon Drift Detector (SDD) detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).
Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.

Silicone Drift Detector technology

A silicon drift detector (SDD) aff ords extremely high count rate capability with excellent spectral resolution. This enables NEX QC+ QuantEZ to deliver the highest precision analytical results in the shortest possible measurement times. The unique engineering feature of SDD is the transversal fi eld generated by a series of ring electrodes that forces charge carriers to “drift” to a small collection electrode. Current generation SDD detectors, with the fi eld eff ect transistor (FET) moved out of the radiation path, represent the state of the art in conventional EDXRF detector technology